Electrical Characteristics of Near-Interface Traps in 3C-SiC Metal Oxide Semiconductor Capacitors
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Author(s)
Kong, Fred CJ
Dimitrijev, Sirna
Han, Jisheng
Dimitrijev, Sirna
Han, Jisheng
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John R Brews
Date
2008
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132667 bytes
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I E E E Electron Device Letters
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29
Issue
9
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© 2008 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
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Subject
Microelectronics