The siloxane film derived from the 30-carbon chain triacontyltrichlorosilane (TCTS) is studied as an anti-relaxation coating for atomic vapor cells. The longitudinal spin relaxation lifetime of optically pumped potassium atoms in the presence of TCTS is measured and the average number of non-relaxing atom-wall collisions, or bounces, enabled by the coated surface is determined. X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) of TCTS were performed to investigate changes in chemical states and surface morphology of TCTS arising from K atom deposition on the film surface. TCTS was found to give approximately 530 bounces. Following lifetime measurements, K2p signals were clearly observed in XPS spectra. AFM images display non-preferential K deposition on the TCTS surface, however additional AFM studies with a TCTS surface exposed to Rb atoms show deposition occurs along surface defects. In agreement, Rb is found to preferentially deposit along the step edges of an 18-carbon chain monolayer film derived from 1-Octadecene. Finally, AFM indicates a much smoother surface for a tetracontane coating relative to TCTS. The importance of siloxane surface morphology versus film thickness with respect to coating performance is discussed.