All-optical self-referenced transverse position sensing with subnanometer precision

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Tischler, Nora
Stark, Johannes
Zambrana-Puyalto, Xavier
Fernandez-Corbaton, Ivan
Vidal, Xavier
Molina-Terriza, Gabriel
Juan, Mathieu L
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2018
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Abstract

The emergence of technologies operating at the nanometer scale for applications as varied as nanofabrication and super-resolution microscopy has driven the need for ever more accurate spatial localization. In this context, nanostructures have been used as probes in order to provide a reference to track lateral drifts in the system. Yet nanometer precision remains challenging and usually involves complicated measurement apparatus. In this work we report a simple method based on symmetry considerations to measure the position of a subwavelength nanostructure. For a particular choice of structures, gold nanoparticles, we demonstrate a subnanometer lateral precision of 0.55 nm. The versatility of the method also allows for the use of different structures, offering a promising opportunity for subnanometer positioning accuracy for a wide variety of systems.

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ACS Photonics
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5
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9
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Copyright © 2018 American Chemical Society. The attached file is reproduced here in accordance with the copyright policy of the publisher. Please refer to the journal's website for access to the definitive, published version.
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Atomic, molecular and optical physics
Photonics, optoelectronics and optical communications
Quantum physics
Electronics, sensors and digital hardware
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